This instrument suited to our needs in terms of providing a full spectrum of elements for processing of geological thin sections as well as a larger sample chamber for rock samples (up to 7 kg). The instrument comes with a capability of analyzing light elements, which is essential
for the planned research. Of particular relevance is the possibility of characterizing elements such as F and C, which will enable identification of important fluoride and carbonate phases relevant in alteration, carbon-sequestration, diagenetic and mineralization studies. The included
software allows for chemical map analysis and automated mineral identification. The instrumentation will allow for detailed textural characterization of samples, quantitative and rigorous classification based on mineral abundances, and allow for rapid identification of materials requiring
more detailed chemical and textural analysis. These mineral maps can be used to provide data such as modal abundance, calculated assay, mineral association and textural aspects, identification and characterization of mineral zoning, and ensure rapid location of accessory phases for
subsequent geochronological investigations. Unique features of the instrument include:
1. Aperture management system (AMS) which minimizes the divergency of the micro collimated X-ray beam, thus allowing characterization of materials with non-planar surfaces.
2. AMICS SW suite as Automated Mineralogy System for micro-XRF. Bruker exclusively offers this automated mineralogy solution for micro-XRF, no other MicroXRF instrument manufacturer can provide this feature.
3. Dual 60sqrmm SDD AND dual X-ray tube configuration whereby the 2nd tube is equipped with a 4-position SW controlled collimator changer (0.5, 1, 2, 4.5 mm).
4. SW programmable vacuum level with closed loop vacuum level monitoring. This is a feature which only Bruker offers (the M4 uses an oil free diaphragm pump instead of a rotary vacuum pump). A controlled vacuum level with no hysteresis is crucial, for example, if light element maps are acquired over a longer period of time. Any variation of the vacuum level can propagate into an intensity variation of light elements (Z < 12).
Aperture management system (AMS) which
minimizes the divergency of the micro
collimated X-ray beam. This feature is
protected by patent EP 3 480 586 A1 (2019).