Machinery & Equipment
Denmark-Copenhagen: Spectrometers
University of Copenhagen has announced on 21 Jan 2022 that is accepting bids for the following project: Denmark-Copenhagen: Spectrometers.
The tender will take place in Denmark and will cover the Machinery & Equipment industry.
The total value of the project is estimated at 3335170, ex VAT and you can apply until 01 Jan 1970.
After the deadline, Global Database will announce the contract award for Denmark-Copenhagen: Spectrometers. In order to stay up-to-date with this tender and also to receive daily notifications about similar projects, you can subscribe to our newsletter for free.
Bellow you can find more information about the tender description and the bidding procedure.
Location: Denmark
University of Copenhagen
Machinery & Equipment
Accepting bids
21 Jan 2022
Not available
3335170
Voluntary ex ante transparency notice
Supplies
Section I: Contracting authority/entity
Section II: Object
Acquisition of a M4 Tornado micro-XRF
IGN is a diverse institute with interdisciplinary research focuses on interactions between humans and our planet. The geology section focuses on multiple areas, including Earth history and evolution, mineral resources, past climate, deep
earth processes, and hydrogeology. The geology section comprises 6 professors, 10 associate professors and 2 adjunct professors, and has an intake of c. 40 new students each year.
The intended purchase is a desktop micro-XRF. The instrument will be used for making detailed chemical maps of rock and mineral samples. The methodology is a significant advance on existing techniques in the Department both in terms of
quality and resolution of images obtained. The instrument will be used as both a fundamental teaching tool and as a research instrument enabling state-of-the-art rock classification and description.
Section IV: Procedure
This instrument suited to our needs in terms of providing a full spectrum of elements for processing of geological thin sections as well as a larger sample chamber for rock samples (up to 7 kg). The instrument comes with a capability of analyzing light elements, which is essential
for the planned research. Of particular relevance is the possibility of characterizing elements such as F and C, which will enable identification of important fluoride and carbonate phases relevant in alteration, carbon-sequestration, diagenetic and mineralization studies. The included
software allows for chemical map analysis and automated mineral identification. The instrumentation will allow for detailed textural characterization of samples, quantitative and rigorous classification based on mineral abundances, and allow for rapid identification of materials requiring
more detailed chemical and textural analysis. These mineral maps can be used to provide data such as modal abundance, calculated assay, mineral association and textural aspects, identification and characterization of mineral zoning, and ensure rapid location of accessory phases for
subsequent geochronological investigations. Unique features of the instrument include:
1. Aperture management system (AMS) which minimizes the divergency of the micro collimated X-ray beam, thus allowing characterization of materials with non-planar surfaces.
2. AMICS SW suite as Automated Mineralogy System for micro-XRF. Bruker exclusively offers this automated mineralogy solution for micro-XRF, no other MicroXRF instrument manufacturer can provide this feature.
3. Dual 60sqrmm SDD AND dual X-ray tube configuration whereby the 2nd tube is equipped with a 4-position SW controlled collimator changer (0.5, 1, 2, 4.5 mm).
4. SW programmable vacuum level with closed loop vacuum level monitoring. This is a feature which only Bruker offers (the M4 uses an oil free diaphragm pump instead of a rotary vacuum pump). A controlled vacuum level with no hysteresis is crucial, for example, if light element maps are acquired over a longer period of time. Any variation of the vacuum level can propagate into an intensity variation of light elements (Z < 12).
Aperture management system (AMS) which
minimizes the divergency of the micro
collimated X-ray beam. This feature is
protected by patent EP 3 480 586 A1 (2019).
Section V: Award of contract/concession
Section VI: Complementary information
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