Machinery & Equipment
Ireland-Cork: Miscellaneous equipment
Ireland-Cork: Miscellaneous equipment has been closed on 05 Oct 2022. It no longer accepts any bids. For further information, you can contact the University College Cork ( UCC ) (N/A)
Bellow, you can find more information about this project:
Location: Ireland
University College Cork ( UCC ) (N/A)
Machinery & Equipment
Closed
04 Aug 2022
05 Oct 2022
Not available
Contract notice
Supplies
Section I: Contracting authority
Section II: Object
Request for Tenders under Open (OJEU) Procedure for the Supply, Delivery and Installation of a Broad Ion Beam Milling System for SP&S for the Tyndall National Institute, UCC
The Specialty Products & Services Group (SP&S) at Tyndall National Institute, UCC, fabricate a wide variety of Semiconductor devices, ranging from traditional Silicon microelectronics and Silicon MEMS to III-V photonic devices. In addition, SP&S provide an extensive array of analysis services in all types of electronic devices and packages to internal and external customers. The Electron Microscopy and Analysis Facility (EMAF) within SP&S utilise a wide range of SEM, TEM and FIB equipment as part of these analysis services. We wish to extend our capability in the area of sample preparation by purchasing a fully functional Broad Ion Beam (BIB) milling system with an ancillary mechanical polishing system which will allow us to bridge a sample cross-section preparation gap between our existing plasma FIB and mechanical methods
Tyndall National Institute, University College Cork
The Specialty Products & Services Group (SP&S) at Tyndall National Institute, UCC, fabricate a wide variety of Semiconductor devices, ranging from traditional Silicon microelectronics and Silicon MEMS to III-V photonic devices. In addition, SP&S provide an extensive array of analysis services in all types of electronic devices and packages to internal and external customers. The Electron Microscopy and Analysis Facility (EMAF) within SP&S utilise a wide range of SEM, TEM and FIB equipment as part of these analysis services. We wish to extend our capability in the area of sample preparation by purchasing a fully functional Broad Ion Beam (BIB) milling system with an ancillary mechanical polishing system which will allow us to bridge a sample cross-section preparation gap between our existing plasma FIB and mechanical methods
RFT allows for additional components to be purchased at a later date subject to budget availability and research needs.
SFI
Refer to RFT
Section III: Legal, economic, financial and technical information
As stated in procurement documents
As per RFT
Section IV: Procedure
Section VI: Complementary information
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