Machinery & Equipment
Ireland-Cork: Miscellaneous equipment
Ireland-Cork: Miscellaneous equipment has been closed on 05 Oct 2022. It no longer accepts any bids. For further information, you can contact the University College Cork ( UCC ) (N/A)
Bellow, you can find more information about this project:
Location: Ireland
University College Cork ( UCC ) (N/A)
Machinery & Equipment
Closed
04 Aug 2022
05 Oct 2022
Not available
Contract notice
Supplies
Section I: Contracting authority
Section II: Object
Request for Tenders under Open (OJEU) Procedure for the Supply, Delivery and Installation of a Broad Ion Beam Milling System for SP&S for the Tyndall National Institute, UCC
The Specialty Products & Services Group (SP&S) at Tyndall National Institute, UCC, fabricate a wide variety of Semiconductor devices, ranging from traditional Silicon microelectronics and Silicon MEMS to III-V photonic devices. In addition, SP&S provide an extensive array of analysis services in all types of electronic devices and packages to internal and external customers. The Electron Microscopy and Analysis Facility (EMAF) within SP&S utilise a wide range of SEM, TEM and FIB equipment as part of these analysis services. We wish to extend our capability in the area of sample preparation by purchasing a fully functional Broad Ion Beam (BIB) milling system with an ancillary mechanical polishing system which will allow us to bridge a sample cross-section preparation gap between our existing plasma FIB and mechanical methods
Tyndall National Institute, University College Cork
The Specialty Products & Services Group (SP&S) at Tyndall National Institute, UCC, fabricate a wide variety of Semiconductor devices, ranging from traditional Silicon microelectronics and Silicon MEMS to III-V photonic devices. In addition, SP&S provide an extensive array of analysis services in all types of electronic devices and packages to internal and external customers. The Electron Microscopy and Analysis Facility (EMAF) within SP&S utilise a wide range of SEM, TEM and FIB equipment as part of these analysis services. We wish to extend our capability in the area of sample preparation by purchasing a fully functional Broad Ion Beam (BIB) milling system with an ancillary mechanical polishing system which will allow us to bridge a sample cross-section preparation gap between our existing plasma FIB and mechanical methods
RFT allows for additional components to be purchased at a later date subject to budget availability and research needs.
SFI
Refer to RFT
Section III: Legal, economic, financial and technical information
As stated in procurement documents
As per RFT
Section IV: Procedure
Section VI: Complementary information
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EUROPEAN CENTRE FOR THE DEVELOPMENT OF VOCATIONAL TRAINING
CZECH DEVELOPMENT AGENCY
EUROPEAN INVESTMENT BANK
GOVERNMENT NOTICES
INTERNATIONAL CRIMINAL COURT
INTERNATIONAL FINANCE CORPORATION
MILLENIUM CHALLENGE CORPORATION
THE PHARMACEUTICALS FUND AND SUPPLY AGENCY
UN HIGH COMMISSIONER FOR REFUGEES
UNITED NATIONS UNIVERSITY
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