Technische Universiteit Delft (27364265 0001) has announced on 16 Apr 2021 that is accepting bids for the following project: Netherlands-Delft: Laboratory, optical and precision equipments (excl. glasses).
The tender will take place in Netherlands and will cover the Machinery & Equipment industry.
The value of this project has not been disclosed by the donor and you can apply until Deadline date
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Bellow you can find more information about the tender description and the bidding procedure.
Location: Netherlands
Technische Universiteit Delft (27364265 0001)
Machinery & Equipment
Accepting bids
16 Apr 2021
Not available
Not available
Prior information notice
This notice is for prior information only
Supplies
Section I: Contracting authority
Section II: Object
X-Ray Diffraction System
An X-ray scattering measurement goniometer setup is sought for the characterization of the structure and morphology of a wide scope of solid materials and especially battery materials under operando conditions. The setup should include the optics to perform X-ray diffraction and total diffraction (PDF) with an Ag X-ray source. This is required for operando transmission studies of thick solid samples (several mm). The aim is to combine diffraction studies (phase transitions, strain, etc.) with morphology studies (homogeneity, porosity, grains/pores size statistics, grain boundary dynamics) on the same samples. For this reason the setup should combine X-ray diffraction with X-ray computed tomorgaphy (CT), the latter with a spatial resolution of at least 5 micrometer.
An X-ray scattering measurement goniometer setup is sought for the characterization of the structure and morphology of a wide scope of solid materials and especially battery materials under operando conditions. The setup should include the optics to perform X-ray diffraction and total diffraction (PDF) with an Ag X-ray source. This is required for operando transmission studies of thick solid samples (several mm). The aim is to combine diffraction studies (phase transitions, strain etc) with morphology studies (homogeneity, porosity, grains/pores size statistics, grain boundary dynamics) on the same samples. For this reason the setup should combine X-ray diffraction with X-ray computed tomorgaphy (CT), the latter with a spatial resolution of at least 5 micrometer.
Section IV: Procedure
Section VI: Complementary information
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